Comparative vision and pattern recognition  proceedings of IEEE held at Sanfrancisco California on Jun, 19 - 23, 1985 

 - North Holland  IEEE computer society press,  1985 
 - xi, 696 p.; ill 
<br/><br/><label>ISBN: </label>444878173 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Artificial intelligence<br/>Computer vision<br/>Image processing<br/>Machine vision<br/>Pattern recognition system